The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition
文献类型:期刊论文
作者 | Wang, H ; Li, SL ; Xiong, H ; Wu, ZH ; Dai, JN ; Tian, Y ; Fang, YY ; Chen, CQ |
刊名 | JOURNAL OF ELECTRONIC MATERIALS
![]() |
出版日期 | 2012 |
卷号 | 41期号:3页码:466-470 |
关键词 | Aluminum nitride nucleation pulsed atomic layer epitaxy metalorganic chemical vapor deposition |
ISSN号 | 0361-5235 |
通讯作者 | Wang, H (reprint author), Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Sch Optoelect Sci & Engn, Wuhan 430074, Peoples R China. |
中文摘要 | AlN epilayers were grown directly on sapphire (0001) substrates using a combined growth scheme, consisting of a low-temperature nucleation layer and a second layer grown by high-temperature pulsed atomic layer epitaxy via metalorganic chemical vapor depos |
学科主题 | Engineering; Materials Science; Physics |
收录类别 | 2012SCI-184 |
原文出处 | 10.1007/s11664-011-1798-3 |
语种 | 英语 |
公开日期 | 2013-04-17 |
源URL | [http://ir.sim.ac.cn/handle/331004/114844] ![]() |
专题 | 上海微系统与信息技术研究所_功能材料与器件_期刊论文 |
推荐引用方式 GB/T 7714 | Wang, H,Li, SL,Xiong, H,et al. The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition[J]. JOURNAL OF ELECTRONIC MATERIALS,2012,41(3):466-470. |
APA | Wang, H.,Li, SL.,Xiong, H.,Wu, ZH.,Dai, JN.,...&Chen, CQ.(2012).The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition.JOURNAL OF ELECTRONIC MATERIALS,41(3),466-470. |
MLA | Wang, H,et al."The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition".JOURNAL OF ELECTRONIC MATERIALS 41.3(2012):466-470. |
入库方式: OAI收割
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。