中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition

文献类型:期刊论文

作者Wang, H ; Li, SL ; Xiong, H ; Wu, ZH ; Dai, JN ; Tian, Y ; Fang, YY ; Chen, CQ
刊名JOURNAL OF ELECTRONIC MATERIALS
出版日期2012
卷号41期号:3页码:466-470
关键词Aluminum nitride nucleation pulsed atomic layer epitaxy metalorganic chemical vapor deposition
ISSN号0361-5235
通讯作者Wang, H (reprint author), Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Sch Optoelect Sci & Engn, Wuhan 430074, Peoples R China.
中文摘要AlN epilayers were grown directly on sapphire (0001) substrates using a combined growth scheme, consisting of a low-temperature nucleation layer and a second layer grown by high-temperature pulsed atomic layer epitaxy via metalorganic chemical vapor depos
学科主题Engineering; Materials Science; Physics
收录类别2012SCI-184
原文出处10.1007/s11664-011-1798-3
语种英语
公开日期2013-04-17
源URL[http://ir.sim.ac.cn/handle/331004/114844]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Wang, H,Li, SL,Xiong, H,et al. The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition[J]. JOURNAL OF ELECTRONIC MATERIALS,2012,41(3):466-470.
APA Wang, H.,Li, SL.,Xiong, H.,Wu, ZH.,Dai, JN.,...&Chen, CQ.(2012).The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition.JOURNAL OF ELECTRONIC MATERIALS,41(3),466-470.
MLA Wang, H,et al."The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition".JOURNAL OF ELECTRONIC MATERIALS 41.3(2012):466-470.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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