中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Liquid-solid interfacial reactions of Sn-Ag and Sn-Ag-In solders with Cu under bump metallization

文献类型:期刊论文

作者Wang, DL ; Yuan, Y ; Luo, L
刊名JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
出版日期2012
卷号23期号:1页码:61-67
ISSN号0957-4522
通讯作者Luo, L (reprint author), Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Transducer Technol, Shanghai 200050, Peoples R China.
中文摘要Intermetallic compounds formed during the liquid-solid interfacial reaction of Sn-Ag and Sn-Ag-In solder bumps on Cu under bump metallization at temperatures ranging from 240 to 300 A degrees C were investigated. Two types of intermetallic compounds layer
学科主题Engineering; Materials Science; Physics
原文出处10.1007/s10854-011-0414-x
公开日期2013-04-25
源URL[http://ir.sim.ac.cn/handle/331004/115075]  
专题上海微系统与信息技术研究所_无线、宽带、通讯技术_期刊论文
推荐引用方式
GB/T 7714
Wang, DL,Yuan, Y,Luo, L. Liquid-solid interfacial reactions of Sn-Ag and Sn-Ag-In solders with Cu under bump metallization[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2012,23(1):61-67.
APA Wang, DL,Yuan, Y,&Luo, L.(2012).Liquid-solid interfacial reactions of Sn-Ag and Sn-Ag-In solders with Cu under bump metallization.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,23(1),61-67.
MLA Wang, DL,et al."Liquid-solid interfacial reactions of Sn-Ag and Sn-Ag-In solders with Cu under bump metallization".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 23.1(2012):61-67.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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