中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Cathodoluminescence study of GaN-based film structures

文献类型:期刊论文

作者Yang H; Zhao DG; Zhu JJ; Zhang SM; Yang H; Jiang DS
刊名journal of materials science-materials in electronics
出版日期2008
卷号19页码:s58-s63 suppl. 1
ISSN号0957-4522
通讯作者jiang, ds, chinese acad sci, inst semicond, state key lab integrated optoelect, pob 912, beijing 100083, peoples r china. 电子邮箱地址: dsjiang@red.semi.ac.cn
中文摘要gan films grown on sapphire substrate with an emphasis on epitaxial lateral overgrown (elog) layers with an array of rhombic shaped mask area as well as ingan/gan mqw laser diode layer structures were investigated by cathodoluminescence (cl) spectroscopy and cl imaging at room and low temperatures. the microscopic imaging with a high-spatial resolution clearly reveals the distribution of threading dislocations and point defects in elog gan films. the secondary electron and cl data measured on cleaved faces of laser diodes are analyzed in consideration with luminescence mechanisms in semiconductor heterostructures and around the p - n junction, providing important information on the defects and carrier dynamics in laser diode devices.
学科主题光电子学
收录类别SCI
语种英语
公开日期2010-03-08
源URL[http://ir.semi.ac.cn/handle/172111/6390]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Yang H,Zhao DG,Zhu JJ,et al. Cathodoluminescence study of GaN-based film structures[J]. journal of materials science-materials in electronics,2008,19:s58-s63 suppl. 1.
APA Yang H,Zhao DG,Zhu JJ,Zhang SM,Yang H,&Jiang DS.(2008).Cathodoluminescence study of GaN-based film structures.journal of materials science-materials in electronics,19,s58-s63 suppl. 1.
MLA Yang H,et al."Cathodoluminescence study of GaN-based film structures".journal of materials science-materials in electronics 19(2008):s58-s63 suppl. 1.

入库方式: OAI收割

来源:半导体研究所

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