Choice of calibration equations in calibrating microwave test fixtures
文献类型：期刊论文
| 作者 | Liu, J ; Feng, WW ; Zhu, NH |
| 刊名 | international journal of electronics
 |
| 出版日期 | 2008 |
| 卷号 | 95期号:8页码:859-866 |
| 关键词 | microwave network analyser microwave measurement calibration test fixture |
| ISSN号 | 0020-7217 |
| 通讯作者 | zhu, nh, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china. 电子邮箱地址: nhzhu@semi.ac.cn |
| 中文摘要 | the error theory of linear equation system has been applied to the calibration procedure of microwave network analyser in this article. a new explanation for the choice of the linear calibration equations is proposed and a general principle for choosing calibration equations is presented. the method can also be used to predict the occurrence of the problem of frequency limitation at some periodic frequencies. this principle is employed to the thru-short-delay (tsd) method and the solution using the chosen equations gives the most accurate results. a good agreement between the theory and the experiment has been obtained. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 资助信息 | national natural science foundation of china 60510173 605360106053600660606019national basic research program of china 2006cb604902 2006cb302806 2006dfa11880 the work is supported in part by the national natural science foundation of china under 60510173, 60536010, 60536006, and 60606019, and in part by the national basic research program of china under 2006cb604902, 2006cb302806, and 2006dfa11880. |
| 语种 | 英语 |
| 公开日期 | 2010-03-08 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/6498]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Liu, J,Feng, WW,Zhu, NH. Choice of calibration equations in calibrating microwave test fixtures[J]. international journal of electronics,2008,95(8):859-866. |
| APA | Liu, J,Feng, WW,&Zhu, NH.(2008).Choice of calibration equations in calibrating microwave test fixtures.international journal of electronics,95(8),859-866. |
| MLA | Liu, J,et al."Choice of calibration equations in calibrating microwave test fixtures".international journal of electronics 95.8(2008):859-866. |
入库方式： OAI收割
来源：半导体研究所
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