中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of p-GaN layer thickness on the performance of p-i-n structure GaN ultraviolet photodetectors

文献类型:期刊论文

作者Zhou, M ; Zhao, DG
刊名acta physica sinica
出版日期2008
卷号57期号:7页码:4570-4574
ISSN号1000-3290
关键词GaN Ultraviolet photodetector quantum efficiency dark current
通讯作者zhao, dg, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china. 电子邮箱地址: dgzhao@red.semi.ac.cn
中文摘要we investigated the influence of thickness of p-gan layer on the performance of p-i-n structure gan ultraviolet photodetector. through the simulation calculation, it was found that both the quantum efficiency and dark current of device decrease when employing thicker p-gan layer, while both the quantum efficiency and dark current increase with decreasing thickness of p-gan layer. it is suggested that the schottky contact junction between the metal and p-gan may be responsible for the incompatible effect. we has to make a suitable choice of the thickness of p-gan in the device design according to the application requirement.
学科主题半导体器件
收录类别SCI
语种中文
公开日期2010-03-08
源URL[http://ir.semi.ac.cn/handle/172111/6544]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Zhou, M,Zhao, DG. Effect of p-GaN layer thickness on the performance of p-i-n structure GaN ultraviolet photodetectors[J]. acta physica sinica,2008,57(7):4570-4574.
APA Zhou, M,&Zhao, DG.(2008).Effect of p-GaN layer thickness on the performance of p-i-n structure GaN ultraviolet photodetectors.acta physica sinica,57(7),4570-4574.
MLA Zhou, M,et al."Effect of p-GaN layer thickness on the performance of p-i-n structure GaN ultraviolet photodetectors".acta physica sinica 57.7(2008):4570-4574.

入库方式: OAI收割

来源:半导体研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。