中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Carrier spin relaxation in (Ga, Mn) As at room temperature

文献类型:期刊论文

作者Liu, XD ; Wang, WZ ; Gao, RX ; Zhao, JH ; Wen, JH ; Lin, WZ ; Lai, TS
刊名acta physica sinica
出版日期2008
卷号57期号:6页码:3857-3861
关键词(Ga time-resolved Kerr spectroscopy electron spin relaxation DP mechanism Mn) As diluted magnetic semiconductor
ISSN号1000-3290
通讯作者lai, ts, sun yat sen univ, dept phys, state key lab optoelect mat & technol, guangzhou 510275, guangdong, peoples r china. 电子邮箱地址: stslts@mail.sysu.edu.cn
中文摘要in this paper, the excitation energy density dependence of carrier spin relaxation is studied at room temperature for the as-grown and annealed (ga, mn) as samples using femtosecond time-resolved pump-probe kerr spectroscopy. it is found that spin relaxation lifetime of electrons lengthens with increasing excitation energy density for both samples, and the annealed ( ga, mn) as has shorter carrier recombination and electron spin relaxation lifetimes as well as larger kerr rotation angle than the as-grown ( ga. mn) as under the same excitation condition. which shows that dp mechanism is dominant in the spin relaxation process for ( ga, mn)as at room temperature. the enhanced ultrafast kerr effect in the annealed (ga,mn)as shows the potential application of the annealed ( ga, mn) as in ultrafast all-optical spin switches, and also provides a further evidence for the p-d exchange mechanism of the ferromagnetic origin of (ga, mn) as.
学科主题半导体物理
收录类别SCI
语种中文
公开日期2010-03-08
源URL[http://ir.semi.ac.cn/handle/172111/6624]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Liu, XD,Wang, WZ,Gao, RX,et al. Carrier spin relaxation in (Ga, Mn) As at room temperature[J]. acta physica sinica,2008,57(6):3857-3861.
APA Liu, XD.,Wang, WZ.,Gao, RX.,Zhao, JH.,Wen, JH.,...&Lai, TS.(2008).Carrier spin relaxation in (Ga, Mn) As at room temperature.acta physica sinica,57(6),3857-3861.
MLA Liu, XD,et al."Carrier spin relaxation in (Ga, Mn) As at room temperature".acta physica sinica 57.6(2008):3857-3861.

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来源:半导体研究所

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