Characterization of parasitics from scattering parameters of laser diode
文献类型：期刊论文
| 作者 | Zhang, SJ ; Zhu, NH ; Liu, Y ; Liu, YZ |
| 刊名 | microwave and optical technology letters
 |
| 出版日期 | 2008 |
| 卷号 | 50期号:1页码:1-4 |
| 关键词 | semiconductor lasers parasitic network parasitics scattering parameters |
| ISSN号 | 0895-2477 |
| 通讯作者 | zhang, sj, univ elect sci & technol china, sch optoelect informat, chengdu 610054, peoples r china. 电子邮箱地址: sjzhang@uestc.edu.cn |
| 中文摘要 | a novel method for characterizing the parasitics of parasitic network is proposed based on the relations between the scattering parameters of a semiconductor laser chip and laser diode. experiments are designed and performed using our method. the analysis results are in good agreement with the measurements. furthermore, how the parasitics change with the parasitic element values are investigated. the method only needs reflection coefficient of laser diode to be measured, which is simple because of the developed electrical-domain measurement techniques. 2007 wiley periodicals, inc. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-03-08 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/6932]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhang, SJ,Zhu, NH,Liu, Y,et al. Characterization of parasitics from scattering parameters of laser diode[J]. microwave and optical technology letters,2008,50(1):1-4. |
| APA | Zhang, SJ,Zhu, NH,Liu, Y,&Liu, YZ.(2008).Characterization of parasitics from scattering parameters of laser diode.microwave and optical technology letters,50(1),1-4. |
| MLA | Zhang, SJ,et al."Characterization of parasitics from scattering parameters of laser diode".microwave and optical technology letters 50.1(2008):1-4. |
入库方式： OAI收割
来源：半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。