中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
GaAs-Based Metamorphic Long-Wavelength InAs Quantum Dots Grown by Molecular Beam Epitaxy

文献类型:期刊论文

作者Xu YQ
刊名chinese physics letters
出版日期2009
卷号26期号:6页码:art. no. 067801
关键词MU-M LASER ISLANDS
ISSN号0256-307x
通讯作者wang pf chinese acad sci inst semicond state key lab superlattice & microstruct beijing 100083 peoples r china. e-mail address: pfwang@semi.ac.cn
中文摘要a bilayer stacked inas/gaas quantum dot structure grown by molecular beam epitaxy on an in0.05ga0.95as metamorphic buffer is investigated. by introducing a ingaas sb cover layer on the upper inas quantum dots (qds) layers, the emission wavelength of the qds is extended successfully to 1.533 mu m at room temperature, and the density of the qds is in the range of 4 x 10(9) -8 x 10(9) cm(-2). strong photoluminescence (pl) intensity with a full width at half maximum of 28.6 mev of the pl spectrum shows good optical quality of the bilayer qds. the growth of bilayer qds on metamorphic buffers offers a useful way to extend the wavelengths of gaas-based materials for potential applications in optoelectronic and quantum functional devices.
学科主题半导体物理
收录类别SCI
资助信息national natural science foundation of china 60625405 10734060national basic research program of china 2006cb921504 supported by the national natural science foundation of china under grant nos 60625405 and 10734060, and the national basic research program of china under grant no 2006cb921504.
语种英语
公开日期2010-03-08
源URL[http://ir.semi.ac.cn/handle/172111/7171]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Xu YQ. GaAs-Based Metamorphic Long-Wavelength InAs Quantum Dots Grown by Molecular Beam Epitaxy[J]. chinese physics letters,2009,26(6):art. no. 067801.
APA Xu YQ.(2009).GaAs-Based Metamorphic Long-Wavelength InAs Quantum Dots Grown by Molecular Beam Epitaxy.chinese physics letters,26(6),art. no. 067801.
MLA Xu YQ."GaAs-Based Metamorphic Long-Wavelength InAs Quantum Dots Grown by Molecular Beam Epitaxy".chinese physics letters 26.6(2009):art. no. 067801.

入库方式: OAI收割

来源:半导体研究所

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