Analysis of bias effects on the total ionizing dose response in a 180 nm technology
文献类型：期刊论文
| 作者 | Liu, ZL ; Hu, ZY ; Zhang, Z（重点实验室）X ; Shao, H ; Chen, M ; Bi, DW ; Ning, BX ; Zou, SC（重点实验室） |
| 刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
 |
| 出版日期 | 2011 |
| 卷号 | 644期号:1页码:48-54 |
| 关键词 | Instruments & Instrumentation Physics Nuclear Science & Technology Particles & Fields Spectroscopy |
| ISSN号 | 0168-9002 |
| 学科主题 | Instruments & Instrumentation; Nuclear Science & Technology; Physics; Spectroscopy |
| 收录类别 | SCI |
| 原文出处 | 10.1016/j.nima.2011.04.037 |
| 语种 | 英语 |
| 公开日期 | 2013-05-10 |
| 源URL | [http://ir.sim.ac.cn/handle/331004/115131]  |
| 专题 | 上海微系统与信息技术研究所_信息功能材料国家重点实验室2008-2012_期刊论文 |
| 推荐引用方式 GB/T 7714 | Liu, ZL,Hu, ZY,Zhang, Z,et al. Analysis of bias effects on the total ionizing dose response in a 180 nm technology[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,2011,644(1):48-54. |
| APA | Liu, ZL.,Hu, ZY.,Zhang, Z.,Shao, H.,Chen, M.,...&Zou, SC.(2011).Analysis of bias effects on the total ionizing dose response in a 180 nm technology.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,644(1),48-54. |
| MLA | Liu, ZL,et al."Analysis of bias effects on the total ionizing dose response in a 180 nm technology".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 644.1(2011):48-54. |
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