The structure and electrical properties of HfTaON high-k films prepared by DIBSD
文献类型:期刊论文
作者 | Yu, T ; Jin, CG ; Yang, XM ; Dong, YJ ; Zhang, HY ; Zhuge, LJ ; Wu, XM ; Wu, ZF |
刊名 | APPLIED SURFACE SCIENCE
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出版日期 | 2012 |
卷号 | 258期号:7页码:2953-2958 |
关键词 | Chemistry Materials Science Physics Physics Physical Coatings & Films Applied Condensed Matter |
ISSN号 | 0169-4332 |
学科主题 | Chemistry; Materials Science; Physics |
收录类别 | SCI |
原文出处 | 10.1016/j.apsusc.2011.11.015 |
语种 | 英语 |
公开日期 | 2013-05-10 |
源URL | [http://ir.sim.ac.cn/handle/331004/115141] ![]() |
专题 | 上海微系统与信息技术研究所_信息功能材料国家重点实验室2008-2012_期刊论文 |
推荐引用方式 GB/T 7714 | Yu, T,Jin, CG,Yang, XM,et al. The structure and electrical properties of HfTaON high-k films prepared by DIBSD[J]. APPLIED SURFACE SCIENCE,2012,258(7):2953-2958. |
APA | Yu, T.,Jin, CG.,Yang, XM.,Dong, YJ.,Zhang, HY.,...&Wu, ZF.(2012).The structure and electrical properties of HfTaON high-k films prepared by DIBSD.APPLIED SURFACE SCIENCE,258(7),2953-2958. |
MLA | Yu, T,et al."The structure and electrical properties of HfTaON high-k films prepared by DIBSD".APPLIED SURFACE SCIENCE 258.7(2012):2953-2958. |
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