中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Optical waveguide propagation loss measurement using multiple reflections method

文献类型:期刊论文

作者Chen SW ; Yan QF ; Xu QY ; Fan ZC ; Liu JW
刊名optics communications
出版日期2005
卷号256期号:1-3页码:68-72
关键词optical waveguide
ISSN号0030-4018
通讯作者chen, sw, chinese acad sci, inst semicond, state key lab integrated optoelect, jia 35,qinghua east rd, beijing 100083, peoples r china. 电子邮箱地址: swchen@red.semi.ac.cn
中文摘要optical waveguide propagation loss measurement method based on optical multiple reflections detection is presented in this paper. by using a precision reflectometer, uncertain influence on waveguide propagation loss measurement caused by fiber-waveguide coupling can be eliminated effectively and the waveguide net propagation loss can be measured accurately. to demonstrate this, the propagation loss of a silicon-on-insulator (soi) rib waveguide fabricated by rie is measured with the obtained value being 4.3 db/cm. this method provides a non-destructive means for evaluating waveguide propagation loss. (c) 2005 elsevier b.v. all rights reserved.
学科主题光电子学
收录类别SCI
语种英语
公开日期2010-03-17
源URL[http://ir.semi.ac.cn/handle/172111/8406]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Chen SW,Yan QF,Xu QY,et al. Optical waveguide propagation loss measurement using multiple reflections method[J]. optics communications,2005,256(1-3):68-72.
APA Chen SW,Yan QF,Xu QY,Fan ZC,&Liu JW.(2005).Optical waveguide propagation loss measurement using multiple reflections method.optics communications,256(1-3),68-72.
MLA Chen SW,et al."Optical waveguide propagation loss measurement using multiple reflections method".optics communications 256.1-3(2005):68-72.

入库方式: OAI收割

来源:半导体研究所

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