Influence of thermal isolating grooves on the performance of the Mach-Zehnder interferometer-type thermo-optic variable optical attenuator
文献类型:期刊论文
作者 | He, YJ ; Yang, L ; Fang, Q ; Xin, HL ; Li, F ; Liu, YL |
刊名 | optical engineering |
出版日期 | 2005 |
卷号 | 44期号:4页码:art.no.040504 |
ISSN号 | 0091-3286 |
关键词 | variable optical attenuator |
通讯作者 | he, yj, chinese acad sci, inst semicond, res & dev ctr optoelect, beijing 100083, peoples r china. 电子邮箱地址: yjhe@red.semi.ac.cn |
中文摘要 | two types of silicon-on-insulator thermo-optic variable optical attenuators (voas) based on a mach-zehnder interferometer and a multimode-interference coupler are fabricated, one with thermal isolating grooves to improve heating efficiency and the other without comparison of optical and electrical properties, such as insertion losses, the maximum attenuation levels and the corresponding power consumptions, and the response times, is carried out between the two types of voas. the comparison results indicate that use of thermal isolating grooves leads to better values for most characteristics and is an effective way to improve the performance of mach-zehnder interferometer-type thermo-optic devices. (c) 2005 society of photo-optical instrumentation engineers. |
学科主题 | 光电子学 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-03-17 |
源URL | [http://ir.semi.ac.cn/handle/172111/8468] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | He, YJ,Yang, L,Fang, Q,et al. Influence of thermal isolating grooves on the performance of the Mach-Zehnder interferometer-type thermo-optic variable optical attenuator[J]. optical engineering,2005,44(4):art.no.040504. |
APA | He, YJ,Yang, L,Fang, Q,Xin, HL,Li, F,&Liu, YL.(2005).Influence of thermal isolating grooves on the performance of the Mach-Zehnder interferometer-type thermo-optic variable optical attenuator.optical engineering,44(4),art.no.040504. |
MLA | He, YJ,et al."Influence of thermal isolating grooves on the performance of the Mach-Zehnder interferometer-type thermo-optic variable optical attenuator".optical engineering 44.4(2005):art.no.040504. |
入库方式: OAI收割
来源:半导体研究所
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