An improved TM method for full two-port calibration of the asymmetric test fixtures
文献类型：期刊论文
| 作者 | Zhu NH ; Liu C ; Pun EYB ; Chung PS |
| 刊名 | microwave and optical technology letters
 |
| 出版日期 | 2005 |
| 卷号 | 45期号:5页码:438-441 |
| 关键词 | calibration |
| ISSN号 | 0895-2477 |
| 通讯作者 | zhu, nh, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china. |
| 中文摘要 | three known standards, including at least one transmission standard, are normally required for the full two-port calibration of test fixtures. based on the triple-through method, a new general-purpose calibration procedure using only one known reflection standard is proposed in this paper. the experimental results show that our method call provide a simple and accurate approach to fall two-port calibration of the asymmetric test fixtures. (c) 2005 wiley periodicals, inc. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-03-17 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/8750]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhu NH,Liu C,Pun EYB,et al. An improved TM method for full two-port calibration of the asymmetric test fixtures[J]. microwave and optical technology letters,2005,45(5):438-441. |
| APA | Zhu NH,Liu C,Pun EYB,&Chung PS.(2005).An improved TM method for full two-port calibration of the asymmetric test fixtures.microwave and optical technology letters,45(5),438-441. |
| MLA | Zhu NH,et al."An improved TM method for full two-port calibration of the asymmetric test fixtures".microwave and optical technology letters 45.5(2005):438-441. |
入库方式： OAI收割
来源：半导体研究所
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