中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The structural and photoluminescence character of InAs quantum dots grown on a combined InAlAs and GaAs strained buffer

文献类型:期刊论文

作者Shi, GX ; Xu, B ; Jin, P ; Ye, XL ; Cui, CX ; Zhang, CL ; Wu, J ; Wang, ZG
刊名pricm 5: the fifth pacific rim international conference on advanced materials and processing
出版日期2005
卷号pts 1-5期号:475-479页码:1791-1794
ISSN号0255-5476
关键词quantum dots strain buffer layer InAs photoluminescence WELL LASER LAYER
通讯作者shi, gx, chinese acad sci, inst semicond, key lab semicond mat sci, pob 912, beijing 100083, peoples r china. 电子邮箱地址: gxshi@red.semi.ac.cn
中文摘要the structural and photoluminescence (pl) properties of the inas quantum dots (qds) grown on a combined inalas and gaas strained buffer layer have been investigated by afm and pl measurements. the dependence of the critical thickness for the transition from 2d to 3d on the thickness of gaas layer is demonstrated directly by rheed. the effects of the introduced-inalas layer on the density and the aspect ratio of qds have been discussed.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-03-17
源URL[http://ir.semi.ac.cn/handle/172111/8768]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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GB/T 7714
Shi, GX,Xu, B,Jin, P,et al. The structural and photoluminescence character of InAs quantum dots grown on a combined InAlAs and GaAs strained buffer[J]. pricm 5: the fifth pacific rim international conference on advanced materials and processing,2005,pts 1-5(475-479):1791-1794.
APA Shi, GX.,Xu, B.,Jin, P.,Ye, XL.,Cui, CX.,...&Wang, ZG.(2005).The structural and photoluminescence character of InAs quantum dots grown on a combined InAlAs and GaAs strained buffer.pricm 5: the fifth pacific rim international conference on advanced materials and processing,pts 1-5(475-479),1791-1794.
MLA Shi, GX,et al."The structural and photoluminescence character of InAs quantum dots grown on a combined InAlAs and GaAs strained buffer".pricm 5: the fifth pacific rim international conference on advanced materials and processing pts 1-5.475-479(2005):1791-1794.

入库方式: OAI收割

来源:半导体研究所

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