中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Electric field-induced scatterings in rough quantum wells of AlGaN/GaN high-mobility electronic transistors

文献类型:期刊论文

作者Ji, Dong ; Lu, Yanwu ; Liu, Bing ; Jin, Guangri ; Liu, Guipeng ; Zhu, Qinsheng ; Wang, Zhanguo
刊名journal of applied physics
出版日期2012
卷号112页码:024515
学科主题半导体材料
收录类别EI
语种英语
公开日期2013-05-07
源URL[http://ir.semi.ac.cn/handle/172111/24006]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Ji, Dong,Lu, Yanwu,Liu, Bing,et al. Electric field-induced scatterings in rough quantum wells of AlGaN/GaN high-mobility electronic transistors[J]. journal of applied physics,2012,112:024515.
APA Ji, Dong.,Lu, Yanwu.,Liu, Bing.,Jin, Guangri.,Liu, Guipeng.,...&Wang, Zhanguo.(2012).Electric field-induced scatterings in rough quantum wells of AlGaN/GaN high-mobility electronic transistors.journal of applied physics,112,024515.
MLA Ji, Dong,et al."Electric field-induced scatterings in rough quantum wells of AlGaN/GaN high-mobility electronic transistors".journal of applied physics 112(2012):024515.

入库方式: OAI收割

来源:半导体研究所

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