中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Characteristics of high Al content AlxGa1-xN grown by metalorganic chemical vapor deposition

文献类型:期刊论文

作者Wang XY (Wang, Xiaoyan) ; Wang XL (Wang, Xiaoliang) ; Hu GX (Hu, Guoxin) ; Wang BZ (Wang, Baozhu) ; Ma ZY (Ma, Zhiyong) ; Xiao HL (Xiao, Hongling) ; Wang CM (Wang, Cuimei) ; Ran JX (Ran, Junxue) ; Li JP (Li, Jianping)
刊名microelectronics journal
出版日期2007
卷号38期号:8-9页码:838-841
关键词AlxGa1-xN
ISSN号issn: 0026-2692
通讯作者wang, xy, chinese acad sci, inst semicond, beijing 100083, peoples r china. 电子邮箱地址: xywang@mail.semi.ac.cn
中文摘要the epitaxial growth of alxga1-xn film with high al content by metalorganic chemical vapor deposition (mocvd) has been accomplished. the resulting al content was determined to be 54% by high resolution x-ray diffraction (hrxrd) and vegard's law. the full width at half maximum (fwhm) of the algan (0002) hrxrd rocking curve was about 597 arcsec. atomic force microscopy (afm) image showed a relatively rough surface with grain-like islands, mainly coming from the low surface mobility of adsorbed alspecies. from transmittance measurement, the cut-off wavelength was around 280 nm and fabry-perot fringes were clearly visible in the transmission region. cathodoluminescence (cl) measurement indicated that there existed a uniformity in the growth direction and a non-uniformity in the lateral direction. (c) 2007 elsevier ltd. all rights reserved.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-03-29
源URL[http://ir.semi.ac.cn/handle/172111/9202]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Wang XY ,Wang XL ,Hu GX ,et al. Characteristics of high Al content AlxGa1-xN grown by metalorganic chemical vapor deposition[J]. microelectronics journal,2007,38(8-9):838-841.
APA Wang XY .,Wang XL .,Hu GX .,Wang BZ .,Ma ZY .,...&Li JP .(2007).Characteristics of high Al content AlxGa1-xN grown by metalorganic chemical vapor deposition.microelectronics journal,38(8-9),838-841.
MLA Wang XY ,et al."Characteristics of high Al content AlxGa1-xN grown by metalorganic chemical vapor deposition".microelectronics journal 38.8-9(2007):838-841.

入库方式: OAI收割

来源:半导体研究所

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