中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A study on the minority carrier diffusion length in n-type GaN films

文献类型:期刊论文

作者Deng DM (Deng Dongmei) ; Zhao DG (Zhao Degang) ; Wang JY (Wang Jinyan) ; Yang H (Yang Hui) ; Wen CP (Wen Cheng Paul)
刊名rare metals
出版日期2007
卷号26期号:3页码:271-275
关键词compound semiconductor material
ISSN号issn: 1001-0521
通讯作者deng, dm, peking univ, inst microelect, beijing 100871, peoples r china. 电子邮箱地址: dmdeng@ime.pku.edu.cn
中文摘要the minority carrier diffusion length of n-type gan films grown by metalorganic chemical vapor deposition (mocvd) has been studied by measuring the surface photovoltaic (pv) spectra. it was found that the minority carrier diffusion length of undoped n-type gan is considerably larger than that in lightly si-doped gan. however, the data suggested that the dislocation and electron concentration appear not to be responsible for the minority carrier diffusion length. it is suggested that si doping plays an important role in decreasing the minority carrier diffusion length.
学科主题光电子学
收录类别SCI
语种英语
公开日期2010-03-29
源URL[http://ir.semi.ac.cn/handle/172111/9350]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Deng DM ,Zhao DG ,Wang JY ,et al. A study on the minority carrier diffusion length in n-type GaN films[J]. rare metals,2007,26(3):271-275.
APA Deng DM ,Zhao DG ,Wang JY ,Yang H ,&Wen CP .(2007).A study on the minority carrier diffusion length in n-type GaN films.rare metals,26(3),271-275.
MLA Deng DM ,et al."A study on the minority carrier diffusion length in n-type GaN films".rare metals 26.3(2007):271-275.

入库方式: OAI收割

来源:半导体研究所

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