中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Chemical trends of defect formation in Si quantum dots: The case of group-III and group-V dopants

文献类型:期刊论文

作者Xu Q (Xu Qiang) ; Luo JW (Luo Jun-Wei) ; Li SS (Li Shu-Shen) ; Xia JB (Xia Jian-Bai) ; Li JB (Li Jingbo) ; Wei SH (Wei Su-Huai)
刊名physical review b
出版日期2007
卷号75期号:23页码:art.no.235304
关键词POROUS SILICON
ISSN号issn: 1098-0121
通讯作者li, jb, acad sinica, state key lab superlattices & microstruct, inst semicond, pob 912, beijing 100083, peoples r china.
中文摘要using first-principles methods, we have systematically calculated the defect formation energies and transition energy levels of group-iii and group-v impurities doped in h passivated si quantum dots (qds) as functions of the qd size. the general chemical trends found in the qds are similar to that found in bulk si. we show that defect formation energy and transition energy level increase when the size of the qd decreases; thus, doping in small si qds becomes more difficult. b-si has the lowest acceptor transition energy level, and it is more stable near the surface than at the center of the h passivated si qd. on the other hand, p-si has the smallest donor ionization energy, and it prefers to stay at the interior of the h passivated si qd. we explained the general chemical trends and the dependence on the qd size in terms of the atomic chemical potentials and quantum confinement effects.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-03-29
源URL[http://ir.semi.ac.cn/handle/172111/9366]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Xu Q ,Luo JW ,Li SS ,et al. Chemical trends of defect formation in Si quantum dots: The case of group-III and group-V dopants[J]. physical review b,2007,75(23):art.no.235304.
APA Xu Q ,Luo JW ,Li SS ,Xia JB ,Li JB ,&Wei SH .(2007).Chemical trends of defect formation in Si quantum dots: The case of group-III and group-V dopants.physical review b,75(23),art.no.235304.
MLA Xu Q ,et al."Chemical trends of defect formation in Si quantum dots: The case of group-III and group-V dopants".physical review b 75.23(2007):art.no.235304.

入库方式: OAI收割

来源:半导体研究所

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