Measurement of a reciprocal four-port transmission line structure using the 16-term error model
文献类型：期刊论文
| 作者 | Zhang Y (Zhang, Yun) ; Silvonen K (Silvonen, Kirnmo) ; Zhu NH (Zhu, Ning H.) |
| 刊名 | microwave and optical technology letters
 |
| 出版日期 | 2007 |
| 卷号 | 49期号:7页码:1511-1515 |
| 关键词 | 16-term error model |
| ISSN号 | issn: 0895-2477 |
| 通讯作者 | zhang, y, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china. |
| 中文摘要 | a new method to measure reciprocal four-port structures, using a 16-term error model, is presented. the measurement is based on 5 two-port calibration standards connected to two of the ports, while the network analyzer is connected to the two remaining ports. least-squares-fit data reduction techniques are used to lower error sensitivity. the effect of connectors is deembedded using closed-form equations. (c) 2007 wiley periodicals, inc. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-03-29 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/9442]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhang Y ,Silvonen K ,Zhu NH . Measurement of a reciprocal four-port transmission line structure using the 16-term error model[J]. microwave and optical technology letters,2007,49(7):1511-1515. |
| APA | Zhang Y ,Silvonen K ,&Zhu NH .(2007).Measurement of a reciprocal four-port transmission line structure using the 16-term error model.microwave and optical technology letters,49(7),1511-1515. |
| MLA | Zhang Y ,et al."Measurement of a reciprocal four-port transmission line structure using the 16-term error model".microwave and optical technology letters 49.7(2007):1511-1515. |
入库方式： OAI收割
来源：半导体研究所
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