中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Metamorphic InGaAs quantum wells for light emission at 1.3-1.6 mu m

文献类型:期刊论文

作者Wang SM ; Tangring I ; Gu QF ; Sadeghi M ; Larsson A ; Wang XD ; Ma CH ; Buyanova IA ; Chen WM
刊名thin solid films
出版日期2007
卷号515期号:10页码:4348-4351
关键词metamorphic
ISSN号issn: 0040-6090
通讯作者wang, sm, chalmers, dept microtechnol & nanosci, s-41296 gothenburg, sweden. 电子邮箱地址: shumin.wang@mc2.chalmers.se
中文摘要metamorphic ingaas quantum well structures grown on gaas reveal strong light emission at 1.3-1.6 mu m, smooth surface with an average roughness below 2 nm. and good rectifying i-v characteristics. dark line defects are found in the qw post growth thermal annealing further improves the luminescence efficiency but does not remove those dark line defects. some challenges of epitaxial growth using this method for laser applications are discussed. (c) 2006 elsevier b.v. all rights reserved.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-03-29
源URL[http://ir.semi.ac.cn/handle/172111/9562]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Wang SM,Tangring I,Gu QF,et al. Metamorphic InGaAs quantum wells for light emission at 1.3-1.6 mu m[J]. thin solid films,2007,515(10):4348-4351.
APA Wang SM.,Tangring I.,Gu QF.,Sadeghi M.,Larsson A.,...&Chen WM.(2007).Metamorphic InGaAs quantum wells for light emission at 1.3-1.6 mu m.thin solid films,515(10),4348-4351.
MLA Wang SM,et al."Metamorphic InGaAs quantum wells for light emission at 1.3-1.6 mu m".thin solid films 515.10(2007):4348-4351.

入库方式: OAI收割

来源:半导体研究所

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