中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Evolution of wetting layer of InAs/GaAs quantum dots studied by reflectance difference spectroscopy

文献类型:期刊论文

作者Jin P
刊名applied physics letters
出版日期2006
卷号88期号:7页码:art.no.071903
ISSN号0003-6951
关键词GROWTH INAS GAAS SURFACES
通讯作者chen, yh, chinese acad sci, inst semicond, key lab semicond mat sci, pob 912, beijing 100083, peoples r china. e-mail: yhchen@red.semi.ac.cn
中文摘要for the inas/gaas quantum-dot system, the evolution of the wetting layer (wl) with the inas deposition thickness has been studied by reflectance difference spectroscopy (rds) in combination with atomic force microscopy and photoluminescence. one transition related to the light hole in the wl has been observed clearly in rds, from which its transition energy and in-plane optical anisotropy (oa) are determined. the evolution of wl with the inas dot formation and ripening has been discussed. in addition, the remarkable changes in oa at the onsets of the dot formation and ripening have been observed, implying the mode transitions of atom transport between the wl and the dots.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-04-11
源URL[http://ir.semi.ac.cn/handle/172111/10836]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Jin P. Evolution of wetting layer of InAs/GaAs quantum dots studied by reflectance difference spectroscopy[J]. applied physics letters,2006,88(7):art.no.071903.
APA Jin P.(2006).Evolution of wetting layer of InAs/GaAs quantum dots studied by reflectance difference spectroscopy.applied physics letters,88(7),art.no.071903.
MLA Jin P."Evolution of wetting layer of InAs/GaAs quantum dots studied by reflectance difference spectroscopy".applied physics letters 88.7(2006):art.no.071903.

入库方式: OAI收割

来源:半导体研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。