Study on in-plane optical anisotropy of Si0.75Ge0.25/Si/Si0.5Ge0.5 asymmetric superlattice by reflectance difference spectroscopy - art. no. 071908
文献类型：期刊论文
| 作者 | Zhao L ; Zuo YH ; Shi WH ; Wang QM ; Chen YH ; Wang HN |
| 刊名 | applied physics letters
 |
| 出版日期 | 2006 |
| 卷号 | 88期号:7页码:art.no.0071908 |
| 关键词 | QUANTUM-WELL STRUCTURES LAYER SUPERLATTICES HETEROSTRUCTURES SIGE INTERFACE GROWTH SEMICONDUCTORS MBE |
| ISSN号 | 0003-6951 |
| 通讯作者 | zhao, l, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china. e-mail: leizhao@semi.ac.cn |
| 中文摘要 | si0.75ge0.25/si/si0.5ge0.5 trilayer asymmetric superlattices were prepared on si (001) substrate by ultrahigh vacuum chemical vapor deposition at 500 degrees c. the nonlinear optical response caused by inherent asymmetric interfaces in this structure predicted by theories was verified by in-plane optical anisotropy in (001) plane measured via reflectance difference spectroscopy. the results show si0.75ge0.25/si/si0.5ge0.5 asymmetric superlattice is optically biaxial and the two optical eigen axes in (001) plane are along the directions [110] and [-110], respectively. reflectance difference response between the above two eigen axes can be influenced by the width of the trilayers and reaches as large as similar to 10(-4)-10(-3) in 15-period 2.7 nm-si0.75ge0.25/8 nm-si/1.3 nm-si0.5ge0.5 superlattice when the normal incident light wavelength is in the range of 500-1100 nm, which is quite remarkable because the optical anisotropy does not exist in bulk si. |
| 学科主题 | 人工智能 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-04-11 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/10838]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhao L,Zuo YH,Shi WH,et al. Study on in-plane optical anisotropy of Si0.75Ge0.25/Si/Si0.5Ge0.5 asymmetric superlattice by reflectance difference spectroscopy - art. no. 071908[J]. applied physics letters,2006,88(7):art.no.0071908. |
| APA | Zhao L,Zuo YH,Shi WH,Wang QM,Chen YH,&Wang HN.(2006).Study on in-plane optical anisotropy of Si0.75Ge0.25/Si/Si0.5Ge0.5 asymmetric superlattice by reflectance difference spectroscopy - art. no. 071908.applied physics letters,88(7),art.no.0071908. |
| MLA | Zhao L,et al."Study on in-plane optical anisotropy of Si0.75Ge0.25/Si/Si0.5Ge0.5 asymmetric superlattice by reflectance difference spectroscopy - art. no. 071908".applied physics letters 88.7(2006):art.no.0071908. |
入库方式： OAI收割
来源：半导体研究所
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