Frequency limitation in the calibration of microwave test fixtures
文献类型：期刊论文
| 作者 | Zhu NH ; Qian C ; Wang YL ; Pun EYB ; Chung PS |
| 刊名 | ieee transactions on microwave theory and techniques
 |
| 出版日期 | 2003 |
| 卷号 | 51期号:9页码:2000-2006 |
| 关键词 | calibration deembedding microwave network analyzer scattering parameter measurement test fixture NETWORK-ANALYZER CALIBRATION |
| ISSN号 | 0018-9480 |
| 通讯作者 | zhu nh,chinese acad sci,inst semicond,state key lab integrated optoelect,beijing 100083,peoples r china. |
| 中文摘要 | the problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. for asymmetric test fixtures, a new algorithm based on the thru-short-match (tsm) method is outlined. it is found that the conventional tsm method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. this limitation can be avoided by using a different algorithm. the various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. several ways in avoiding the problem are proposed. there is good agreement between the theories and experimental data. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/11474]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhu NH,Qian C,Wang YL,et al. Frequency limitation in the calibration of microwave test fixtures[J]. ieee transactions on microwave theory and techniques,2003,51(9):2000-2006. |
| APA | Zhu NH,Qian C,Wang YL,Pun EYB,&Chung PS.(2003).Frequency limitation in the calibration of microwave test fixtures.ieee transactions on microwave theory and techniques,51(9),2000-2006. |
| MLA | Zhu NH,et al."Frequency limitation in the calibration of microwave test fixtures".ieee transactions on microwave theory and techniques 51.9(2003):2000-2006. |
入库方式： OAI收割
来源：半导体研究所
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