中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Photoluminesfcence of Er-doped SiO2 films containing Si nanocrystals and Er

文献类型:期刊论文

作者Chen CY ; Chen WD ; Song SF ; Hsu CC
刊名journal of crystal growth
出版日期2003
卷号253期号:1-4页码:10-15
关键词low dimensional structures chemical vapor deposition processes nanomaterials semiconducting materials SILICON NANOCRYSTALS LUMINESCENCE EXCITATION
ISSN号0022-0248
通讯作者chen cy,chinese acad sci,inst semicond,pob 912,beijing 100083,peoples r china.
中文摘要correlations between si nanocrystal (nc-si) related photoluminescence (pl), er3+ emission and nonradiative defects in the er-doped sio2 films containing nc-si (srso) are studied. upon 514.5 nm laser excitation the erbium-doped srso samples exhibit pl peaks at around 0.8 and 1.54 mum, which can be assigned to the electron-hole recombination in nc-si and the intra-4f transition in er3+, respectively. with increasing er3+ content in the films, er3+ emission becomes intense while the pl at 0.8 mum decreases, suggesting a strong coupling of nc-si and er 31 ions. hydrogen plasma treatment for the samples improve the pl intensities of the 0.8 and 1.54 mum bands, indicating h passivation for the nonradiative defects existing in the samples. further-more, from the effect of hydrogen treatment for the samples, we observe variation of the number of nonradiative defects with annealing temperatures. (c) 2003 elsevier science b.v. all rights reserved.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/11542]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Chen CY,Chen WD,Song SF,et al. Photoluminesfcence of Er-doped SiO2 films containing Si nanocrystals and Er[J]. journal of crystal growth,2003,253(1-4):10-15.
APA Chen CY,Chen WD,Song SF,&Hsu CC.(2003).Photoluminesfcence of Er-doped SiO2 films containing Si nanocrystals and Er.journal of crystal growth,253(1-4),10-15.
MLA Chen CY,et al."Photoluminesfcence of Er-doped SiO2 films containing Si nanocrystals and Er".journal of crystal growth 253.1-4(2003):10-15.

入库方式: OAI收割

来源:半导体研究所

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