中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process

文献类型:期刊论文

作者Yu LJ
刊名ieee journal of quantum electronics
出版日期2003
卷号39期号:6页码:716-721
关键词Fourier transform method gain measurement optical spectrum analyzer (OSA) semiconductor laser EMISSION-SPECTRA DIODES
ISSN号0018-9197
通讯作者guo wh,chinese acad sci,inst semicond,state key lab integrated optoelect,beijing 100083,peoples r china.
中文摘要to improve the accuracy of measured gain spectra, which is usually limited by the resolution of the optical spectrum analyzer (osa), a deconvolution process based on the measured spectrum of a narrow linewidth semiconductor laser is applied in the fourier transform method. the numerical simulation shows that practical gain spectra can be resumed by the fourier transform method with the deconvolution process. taking the osa resolution to be 0.06, 0.1, and 0.2 nm, the gain-reflectivity product spectra with the difference of about 2% are obtained for a 1550-nm semiconductor laser with the cavity length of 720 pm. the spectra obtained by the fourier transform method without the deconvolution process and the hakki-paoli method are presented and compared. the simulation also shows that the fourier transform method has less sensitivity to noise than the hakki-paoli method.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/11558]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Yu LJ. Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process[J]. ieee journal of quantum electronics,2003,39(6):716-721.
APA Yu LJ.(2003).Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process.ieee journal of quantum electronics,39(6),716-721.
MLA Yu LJ."Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process".ieee journal of quantum electronics 39.6(2003):716-721.

入库方式: OAI收割

来源:半导体研究所

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