中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth

文献类型:期刊论文

作者Zhang ZC ; Ren BY ; Chen YH ; Yang SY ; Wang ZG
刊名microelectronic engineering
出版日期2003
卷号66期号:1-4页码:504-509
关键词Czochralski method growth from melt semiconductor silicon argon gas flow computer simulation oxygen content FURNACE PRESSURE
ISSN号0167-9317
通讯作者zhang zc,chinese acad sci,inst semicond,lab semicond mat sci,beijing 100083,peoples r china.
中文摘要argon gas, as a protective environment and carrier of latent heat, has an important effect on the temperature distribution in crystals and melts. numeric simulation is a potent tool for solving engineering problems. in this paper, the relationship between argon gas flow and oxygen concentration in silicon crystals was studied systematically. a flowing stream of argon gas is described by numeric simulation for the first time. therefore, the results of experiments can be explained, and the optimum argon flow with the lowest oxygen concentration can be achieved. (c) 2002 elsevier science b.v. all rights reserved.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/11580]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Zhang ZC,Ren BY,Chen YH,et al. Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth[J]. microelectronic engineering,2003,66(1-4):504-509.
APA Zhang ZC,Ren BY,Chen YH,Yang SY,&Wang ZG.(2003).Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth.microelectronic engineering,66(1-4),504-509.
MLA Zhang ZC,et al."Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth".microelectronic engineering 66.1-4(2003):504-509.

入库方式: OAI收割

来源:半导体研究所

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