Two-port calibration of test fixtures with different test ports
文献类型：期刊论文
| 作者 | Zhen YC ; You LW ; Yu L ; Ning HZ |
| 刊名 | microwave and optical technology letters
 |
| 出版日期 | 2002 |
| 卷号 | 35期号:4页码:299-302 |
| 关键词 | two-port calibration microwave network analyzer scattering-parameter measurement phase uncertainty NETWORK-ANALYZER CALIBRATION LINE |
| ISSN号 | 0895-2477 |
| 通讯作者 | zhen yc,chinese acad sci,inst semicond,state key lab integrated optoelect,beijing 100083,peoples r china. |
| 中文摘要 | the open-short-load (osl) method is very simple and widely used for one-port test fixture calibration. in this paper, this method is extended, for the first time, to the two-port calibration of test fixtures with different test ports. the problem of phase uncertainty arising in this application has been solved. the comparison between our results and those obtained with the solt method shows that the method established is accurate for practical applications. (c) 2002 wiley periodicals, inc. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/11748]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhen YC,You LW,Yu L,et al. Two-port calibration of test fixtures with different test ports[J]. microwave and optical technology letters,2002,35(4):299-302. |
| APA | Zhen YC,You LW,Yu L,&Ning HZ.(2002).Two-port calibration of test fixtures with different test ports.microwave and optical technology letters,35(4),299-302. |
| MLA | Zhen YC,et al."Two-port calibration of test fixtures with different test ports".microwave and optical technology letters 35.4(2002):299-302. |
入库方式： OAI收割
来源：半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。