Scattering-parameter measurements of laser diodes
文献类型:期刊论文
作者 | Zhu NH ; Liu Y ; Pun EYB ; Chung PS |
刊名 | optical and quantum electronics
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出版日期 | 2002 |
卷号 | 34期号:8页码:747-757 |
关键词 | microwave network analyzer scattering-parameter measurement semiconductor laser diode test fixture calibration TEST FIXTURES CALIBRATION |
ISSN号 | 0306-8919 |
通讯作者 | zhu nh,chinese acad sci,inst semicond,natl res ctr optoelect technol,state key lab integrated optoelect,pob 912,beijing 100083,peoples r china. |
中文摘要 | an accurate and simple technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips is proposed and demonstrated. all the packaging parasitics could be obtained accurately using a calibrated probe, and the impedance of the intrinsic diode chip is deduced from the directly measured reflection coefficient. the directly measured impedance of a laser diode is affected strongly by the short bond wire. in the frequency response (s(2)1) measurements of semiconductor laser diode chips, the test fixture consists of a microwave probe, a submount, and a bond wire. the s-parameters of the probe could be determined using the short-open-match (som) method. both the attenuation and the reflection of the test fixture have a strong influence on the directly measured frequency response, and in our proposed technique, the effect of test fixture is completely removed. |
学科主题 | 光电子学 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-08-12 |
源URL | [http://ir.semi.ac.cn/handle/172111/11828] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Zhu NH,Liu Y,Pun EYB,et al. Scattering-parameter measurements of laser diodes[J]. optical and quantum electronics,2002,34(8):747-757. |
APA | Zhu NH,Liu Y,Pun EYB,&Chung PS.(2002).Scattering-parameter measurements of laser diodes.optical and quantum electronics,34(8),747-757. |
MLA | Zhu NH,et al."Scattering-parameter measurements of laser diodes".optical and quantum electronics 34.8(2002):747-757. |
入库方式: OAI收割
来源:半导体研究所
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