New algorithms of the TSM and TOM methods for calibrating microwave test fixtures
文献类型：期刊论文
| 作者 | Zhu NH ; Chen ZY ; Wang YL |
| 刊名 | microwave and optical technology letters
 |
| 出版日期 | 2002 |
| 卷号 | 34期号:1页码:26-31 |
| 关键词 | microwave network analyzer test fixtures calibration scattering-parameter measurement NETWORK-ANALYZER CALIBRATION |
| ISSN号 | 0895-2477 |
| 通讯作者 | zhu nh,chinese acad sci,inst semicond,state key lab integrated optoelect,pob 912,beijing 100083,peoples r china. |
| 中文摘要 | based on the conventional through-short-match (tsm) method, an improved tsm method has been proposed in this letter. this method gives an analytical solution and has almost all the advantages of conventional tsm methods. for example, it has no phase uncertainty and no bandwidth limitation. the experimental results show that the accuracy can be significantly improved with this method. the proposed theory can be applied to the through-open-match (tom) method. (c) 2002 wiley periodicals. inc. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/11882]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhu NH,Chen ZY,Wang YL. New algorithms of the TSM and TOM methods for calibrating microwave test fixtures[J]. microwave and optical technology letters,2002,34(1):26-31. |
| APA | Zhu NH,Chen ZY,&Wang YL.(2002).New algorithms of the TSM and TOM methods for calibrating microwave test fixtures.microwave and optical technology letters,34(1),26-31. |
| MLA | Zhu NH,et al."New algorithms of the TSM and TOM methods for calibrating microwave test fixtures".microwave and optical technology letters 34.1(2002):26-31. |
入库方式： OAI收割
来源：半导体研究所
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