Analysis of mode quality factors for equilateral triangle semiconductor microlasers with rough sidewalls
文献类型：期刊论文
| 作者 | Yu LJ
|
| 刊名 | chinese physics letters
 |
| 出版日期 | 2002 |
| 卷号 | 19期号:5页码:674-676 |
| 关键词 | RESONANT FREQUENCIES PADE-APPROXIMATION MICRODISK LASERS FDTD TECHNIQUE |
| ISSN号 | 0256-307x |
| 通讯作者 | huang yz,chinese acad sci,inst semicond,state key lab integrated optoelect,pob 912,beijing 100083,peoples r china. |
| 中文摘要 | the eigenmode characteristics for equilateral triangle resonator (etr) semiconductor microlasers are analysed by the finite-difference time-domain technique and the pade approximation. the random gaussian correlation function and sinusoidal function are used to model the side roughness of the etr. the numerical results show that the roughness can cause the split of the degenerative modes, but the confined modes can still have a high quality factor. for the etr with a 3 mum side length and the sinusoidal fluctuation, we can have a quality factor of 800 for the fundamental mode in the wavelength of 1500 nm, as the amplitude of roughness is 75 mn. |
| 学科主题 | 半导体物理 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/11894]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Yu LJ. Analysis of mode quality factors for equilateral triangle semiconductor microlasers with rough sidewalls[J]. chinese physics letters,2002,19(5):674-676. |
| APA | Yu LJ.(2002).Analysis of mode quality factors for equilateral triangle semiconductor microlasers with rough sidewalls.chinese physics letters,19(5),674-676. |
| MLA | Yu LJ."Analysis of mode quality factors for equilateral triangle semiconductor microlasers with rough sidewalls".chinese physics letters 19.5(2002):674-676. |
入库方式： OAI收割
来源：半导体研究所
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