Content analyses in GaMnAs by double-crystal X-ray diffraction
文献类型：期刊论文
| 作者 | Chen NF ; Xiu HX ; Yang JL ; Wu JL ; Zhong XR ; Lin LY |
| 刊名 | chinese science bulletin
 |
| 出版日期 | 2002 |
| 卷号 | 47期号:4页码:274-275 |
| 关键词 | GaMnAs diluted magnetic semiconductor X-ray diffraction lattice parameter content of Mn SEMICONDUCTOR |
| ISSN号 | 1001-6538 |
| 通讯作者 | chen nf,chinese acad sci,inst semicond,lab semicond mat sci,beijing 100083,peoples r china. |
| 中文摘要 | a model for analyzing point defects in compound crystals was improved. based on this modified model, a method for measuring mn content in gamnas was established. a technique for eliminating the zero-drift-error was also established in the experiments of x-ray diffraction. with these methods, the mn content in gamnas single crystals fabricated by the ion-beam epitaxy system was analyzed. |
| 学科主题 | 半导体物理 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/11922]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Chen NF,Xiu HX,Yang JL,et al. Content analyses in GaMnAs by double-crystal X-ray diffraction[J]. chinese science bulletin,2002,47(4):274-275. |
| APA | Chen NF,Xiu HX,Yang JL,Wu JL,Zhong XR,&Lin LY.(2002).Content analyses in GaMnAs by double-crystal X-ray diffraction.chinese science bulletin,47(4),274-275. |
| MLA | Chen NF,et al."Content analyses in GaMnAs by double-crystal X-ray diffraction".chinese science bulletin 47.4(2002):274-275. |
入库方式： OAI收割
来源：半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。