中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Photoluminescence of rapid-thermal annealed Mg-doped GaN films

文献类型:期刊论文

作者Wang LS ; Fong WK ; Surya C ; Cheah KW ; Zheng WH ; Wang ZG
刊名solid-state electronics
出版日期2001
卷号45期号:7页码:1153-1157
关键词p-type GaN metalorganic chemical vapor deposition photoluminescence X-ray diffraction rapid-thermal annealing P-TYPE GAN RECOMBINATION EMISSION ENERGY BANDS
ISSN号0038-1101
通讯作者surya c,hong kong polytech univ,dept elect & informat engn,yuk choi rd,hund hom,kowloon,hong kong,peoples r china.
中文摘要we report the investigation of temperature and excitation power dependence in photoluminescence spectroscopy measured in mg-doped gan epitaxial layers grown on sapphire by metalorganic chemical vapor deposition, the objective is to examine the effects of rapid-thermal annealing on mg-related emissions. it is observed that the peak position of the 2.7-2.8 ev emission line is a function of the device temperature and annealing conditions, the phenomenon is attributed to coulomb-potential fluctuations in the conduction and valence band edge and impurity levels due to the mg-related complex dissociation. the blue shift of the 2.7-2.8 ev emission line with increasing excitation power provides clear evidence that a donor-acceptor recombination process underlies the observed emission spectrum. in addition, quenching of minor peaks at 3.2 and 3.3 ev are observed and their possible origin is discussed. (c) 2001 elsevier science ltd. all rights reserved.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/12104]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Wang LS,Fong WK,Surya C,et al. Photoluminescence of rapid-thermal annealed Mg-doped GaN films[J]. solid-state electronics,2001,45(7):1153-1157.
APA Wang LS,Fong WK,Surya C,Cheah KW,Zheng WH,&Wang ZG.(2001).Photoluminescence of rapid-thermal annealed Mg-doped GaN films.solid-state electronics,45(7),1153-1157.
MLA Wang LS,et al."Photoluminescence of rapid-thermal annealed Mg-doped GaN films".solid-state electronics 45.7(2001):1153-1157.

入库方式: OAI收割

来源:半导体研究所

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