中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Polarity dependence of hexagonal GaN films on two opposite c faces of Al2O3 substrate

文献类型:期刊论文

作者Han PD
刊名applied physics letters
出版日期2001
卷号78期号:25页码:3974-3976
关键词MOLECULAR-BEAM EPITAXY SURFACE POLARITY SINGLE-CRYSTALS BUFFER LAYER GROWN GAN DEPOSITION MORPHOLOGY QUALITY ZNO
ISSN号0003-6951
通讯作者han pd,chinese acad sci,inst semicond,lab semicond mat sci,pob 912,beijing 100083,peoples r china.
中文摘要gan films were grown in pairs on two opposite c faces of al2o3 substrate by low-pressure metal-organic vapor phase epitaxy, and studied by scanning electron microscopy and converged beam electron diffraction. it is found that gan film on the c-al2o3 whose c face is forward to its crystal seed has [0001] polarity, and the other film on the c-al2o3 whose c face is backward to its crystal seed has [000 (1) over bar] polarity. (c) 2001 american institute of physics.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/12198]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Han PD. Polarity dependence of hexagonal GaN films on two opposite c faces of Al2O3 substrate[J]. applied physics letters,2001,78(25):3974-3976.
APA Han PD.(2001).Polarity dependence of hexagonal GaN films on two opposite c faces of Al2O3 substrate.applied physics letters,78(25),3974-3976.
MLA Han PD."Polarity dependence of hexagonal GaN films on two opposite c faces of Al2O3 substrate".applied physics letters 78.25(2001):3974-3976.

入库方式: OAI收割

来源:半导体研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。