Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers
文献类型：期刊论文
| 作者 | Qu B ; Zheng XH ; Wang YT ; Feng ZH ; Han JY ; Liu S ; Lin SM ; Yang H ; Liang JW |
| 刊名 | science in china series a-mathematics physics astronomy
 |
| 出版日期 | 2001 |
| 卷号 | 44期号:4页码:497-503 |
| ISSN号 | 1006-9283 |
| 关键词 | four-circle diffraction GaN phase content MOLECULAR-BEAM EPITAXY GAN FILMS GROWTH STABILITY RATIO |
| 通讯作者 | qu b,chinese acad sci,inst semicond,beijing 100083,peoples r china. |
| 中文摘要 | on the basis of integrated intensity of rocking curves, the multiplicity factor and the diffraction geometry factor for single crystal x-ray diffraction (xrd) analysis were proposed and a general formula for calculating the content of mixed phases was obtained. with a multifunction four-circle x-ray double-crystal diffractometer, pole figures of cubic (002), {111} and hexagonal {1010} and reciprocal space mapping were measured to investigate the distributive character of mixed phases and to obtain their multiplicity factors and diffraction geometry factors. the contents of cubic twins and hexagonal inclusions were calculated by the integrated intensities of rocking curves of cubic (002), cubic twin {111}, hexagonal {1010} and {1011}. |
| 学科主题 | 半导体物理 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/12226]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Qu B,Zheng XH,Wang YT,et al. Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers[J]. science in china series a-mathematics physics astronomy,2001,44(4):497-503. |
| APA | Qu B.,Zheng XH.,Wang YT.,Feng ZH.,Han JY.,...&Liang JW.(2001).Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers.science in china series a-mathematics physics astronomy,44(4),497-503. |
| MLA | Qu B,et al."Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers".science in china series a-mathematics physics astronomy 44.4(2001):497-503. |
入库方式： OAI收割
来源：半导体研究所
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