中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study of rapid carrier capture and relaxation in InAs/GaAs heterostructures

文献类型:期刊论文

作者Li Q ; Xu ZY ; Ge WK
刊名journal of infrared and millimeter waves
出版日期2000
卷号19期号:5页码:343-346
关键词ultrafast spectroscopy low-dimension heterostructure III-V semiconductors QUANTUM DOTS ELECTRON RELAXATION GAAS
ISSN号1001-9014
通讯作者li q,chinese acad sci,inst semicond,natl lab superlattices & microstruct,beijing 100083,peoples r china.
中文摘要the rapid carrier capture and relaxation processes in inas/gaas quantum dots were studied at 77k by using a simple degenerate pump-probe technique. a rising process was observed in the transient reflectivity, following the initial fast relaxation associated with gaas bulk matrix, and this rising process was assigned to be related to the carrier capture from the gaas barriers to inas layers. the assignment was modeled using kramers-kronig relation. by analyzing the rising process observed in the transient reflectivity, the carrier capture time constants were obtained. the measured capture times decrease with the increase of carrier concentration.
学科主题光电子学
收录类别SCI
语种中文
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/12392]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Li Q,Xu ZY,Ge WK. Study of rapid carrier capture and relaxation in InAs/GaAs heterostructures[J]. journal of infrared and millimeter waves,2000,19(5):343-346.
APA Li Q,Xu ZY,&Ge WK.(2000).Study of rapid carrier capture and relaxation in InAs/GaAs heterostructures.journal of infrared and millimeter waves,19(5),343-346.
MLA Li Q,et al."Study of rapid carrier capture and relaxation in InAs/GaAs heterostructures".journal of infrared and millimeter waves 19.5(2000):343-346.

入库方式: OAI收割

来源:半导体研究所

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