中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Point defects in III-V compound semiconductors

文献类型:期刊论文

作者Chen N
刊名defects and diffusion in semiconductors
出版日期2000
卷号183-1期号:0页码:85-93
关键词compound semiconductors point defects deep level centres stoichiometry MOLECULAR-BEAM EPITAXY GAAS SINGLE-CRYSTALS SEMIINSULATING GALLIUM-ARSENIDE SEMI-INSULATING GAAS ELECTRICAL-PROPERTIES LATTICE-PARAMETER NATIVE DEFECTS CARBON DIFFRACTOMETER STOICHIOMETRY
ISSN号1012-0386
通讯作者chen n,chinese acad sci,inst semicond,lab semicond mat sci,beijing 100864,peoples r china.
中文摘要point defects in iii-v compound semiconductors were analyzed systematically in this paper. the effects of substitutes, antisites, interstitials, and vacancies on lattice parameters in iii-v compound semiconductors were calculated with a simple model. the formation energies of vacancies in compound semiconductors can be obtained by this calculation. a practical technique established on this model has been utilized for measuring the stoichiometry in gaas. the relationship between stoichiometry and deep level centers in gaas was also investigated.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/12404]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Chen N. Point defects in III-V compound semiconductors[J]. defects and diffusion in semiconductors,2000,183-1(0):85-93.
APA Chen N.(2000).Point defects in III-V compound semiconductors.defects and diffusion in semiconductors,183-1(0),85-93.
MLA Chen N."Point defects in III-V compound semiconductors".defects and diffusion in semiconductors 183-1.0(2000):85-93.

入库方式: OAI收割

来源:半导体研究所

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