Point defects in III-V compound semiconductors
文献类型:期刊论文
作者 | Chen N |
刊名 | defects and diffusion in semiconductors
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出版日期 | 2000 |
卷号 | 183-1期号:0页码:85-93 |
关键词 | compound semiconductors point defects deep level centres stoichiometry MOLECULAR-BEAM EPITAXY GAAS SINGLE-CRYSTALS SEMIINSULATING GALLIUM-ARSENIDE SEMI-INSULATING GAAS ELECTRICAL-PROPERTIES LATTICE-PARAMETER NATIVE DEFECTS CARBON DIFFRACTOMETER STOICHIOMETRY |
ISSN号 | 1012-0386 |
通讯作者 | chen n,chinese acad sci,inst semicond,lab semicond mat sci,beijing 100864,peoples r china. |
中文摘要 | point defects in iii-v compound semiconductors were analyzed systematically in this paper. the effects of substitutes, antisites, interstitials, and vacancies on lattice parameters in iii-v compound semiconductors were calculated with a simple model. the formation energies of vacancies in compound semiconductors can be obtained by this calculation. a practical technique established on this model has been utilized for measuring the stoichiometry in gaas. the relationship between stoichiometry and deep level centers in gaas was also investigated. |
学科主题 | 半导体材料 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-08-12 |
源URL | [http://ir.semi.ac.cn/handle/172111/12404] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Chen N. Point defects in III-V compound semiconductors[J]. defects and diffusion in semiconductors,2000,183-1(0):85-93. |
APA | Chen N.(2000).Point defects in III-V compound semiconductors.defects and diffusion in semiconductors,183-1(0),85-93. |
MLA | Chen N."Point defects in III-V compound semiconductors".defects and diffusion in semiconductors 183-1.0(2000):85-93. |
入库方式: OAI收割
来源:半导体研究所
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