中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Formation of InAs quantum dots on low-temperature GaAs epi-layer

文献类型:期刊论文

作者Wang XD ; Niu ZC ; Wang H ; Feng SL
刊名journal of crystal growth
出版日期2000
卷号218期号:2-4页码:209-213
关键词quantum dot low-temperature GaAs As precipitates annealing TEM PL MOLECULAR-BEAM EPITAXY ISLANDS GROWTH SURFACES
ISSN号0022-0248
通讯作者wang xd,chinese acad sci,inst semicond,natl lab superlattices & microstruct,pob 912,beijing 100083,peoples r china.
中文摘要inas self-organized quantum dots (qds) grown on annealed low-temperature gaas (lt-gaas) epi-layers and on normal temperature gaas buffer layers have been compared by transmission electron microscopy (tem) and photoluminescence (pl) measurements. tem evidences that self-organized qds were formed with a smaller size and larger density than that on normal gaas buffer layers. it is discussed that local tensile surface strain regions that are preferred sites for inas islands nucleation are increased in the case of the lt-gaas buffer layers due to exhibiting as precipitates. the pl spectra show a blue-shifted peak energy with narrower linewidth revealing the improvement of optical properties of the qds grown on lt-gaas epi-layers. it suggests us a new way to improve the uniformity and change the energy band structure of the inas self-organized qds by carefully controlling the surface stress states of the lt-gaas buffers on which the qds are formed. (c) 2000 elsevier science b.v. all rights reserved.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/12418]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Wang XD,Niu ZC,Wang H,et al. Formation of InAs quantum dots on low-temperature GaAs epi-layer[J]. journal of crystal growth,2000,218(2-4):209-213.
APA Wang XD,Niu ZC,Wang H,&Feng SL.(2000).Formation of InAs quantum dots on low-temperature GaAs epi-layer.journal of crystal growth,218(2-4),209-213.
MLA Wang XD,et al."Formation of InAs quantum dots on low-temperature GaAs epi-layer".journal of crystal growth 218.2-4(2000):209-213.

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来源:半导体研究所

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