Focal length and focal depth of metallic superlens
文献类型:会议论文
作者 | Pengfei Cao ; Lin Cheng ; Ying Li ; Xiaoping Zhang ; Weijie Kong ; Li Gong ; Xining Zhao |
出版日期 | 2012 |
会议名称 | 6th international symposium on advanced optical manufacturing and testing technologies: design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems |
会议日期 | april 26, 2012 - april 29, 2012 |
会议地点 | xiamen, china |
卷号 | 8418 |
页码 | 841803 |
中文摘要 | we consider the problems of focal length and focal depth of subwavelength imaging via a silver slab of metallic superlens. the performance limit of the metallic superlens was associated with the losses in the metallic film. the transmittance through a metal film is quite low and decreases exponentially with the thickness of the metal film. in the visible wavelength region, the permittivity of ag can be approximated by the drude model, so it can be described as the plural permittivity. the real part (ε') of permittivity of the metal slab has been preferably index matched to the host material, and the imaginary part (ε'') is considered to prevent ideal reconstruction of the image. because superlens are usually made of metals with significant intrinsic loss (ε''>0), the image is blurred and it is regarded as an ultimate limitation to a near field perfect lens. the real part (ε')and the imaginary part (ε'') of permittivity of the metal slab is the function of the incident wavelength, so we discuss the relationship of the focal length, focal depth and the incident wavelength. we also derive the expression for the resolution limit of metallic lens and demonstrate that the area of its subwavelength performance is usually limited to the near-field zone. |
收录类别 | CPCI(ISTP) ; EI |
合作状况 | 国内 |
会议主办者 | the chinese optical society (cos); inst. opt. electron. (ioe), chinese acad. sci. (cas) |
会议录 | 6th international symposium on advanced optical manufacturing and testing technologies: design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems
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会议录出版者 | spie |
会议录出版地 | p.o. box 10, bellingham, wa 98227-0010, united states |
语种 | 英语 |
ISSN号 | 0277786x |
ISBN号 | 9780819491008 |
源URL | [http://ir.opt.ac.cn/handle/181661/20804] ![]() |
专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
推荐引用方式 GB/T 7714 | Pengfei Cao,Lin Cheng,Ying Li,et al. Focal length and focal depth of metallic superlens[C]. 见:6th international symposium on advanced optical manufacturing and testing technologies: design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems. xiamen, china. april 26, 2012 - april 29, 2012. |
入库方式: OAI收割
来源:西安光学精密机械研究所
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