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Phase uncertainty in calibrating microwave test fixtures
文献类型：期刊论文
| 作者 | Zhu NH |
| 刊名 | ieee transactions on microwave theory and techniques
 |
| 出版日期 | 1999 |
| 卷号 | 47期号:10页码:1917-1922 |
| 关键词 | calibration microwave network analyzer scattering-parameter measurement test fixtures PARAMETERS NETWORK-ANALYZER CALIBRATION |
| ISSN号 | 0018-9480 |
| 通讯作者 | zhu nh,chinese acad sci,inst semicond,beijing 100083,peoples r china. |
| 中文摘要 | the problem of phase uncertainty arising in calibration of the test fixtures is investigated in this paper, it is shown that the problem exists no matter what kinds of calibration standards are used. it is also found that there is no need to determine the individual s-parameters of the test fixtures. in order to eliminate the problem of phase uncertainty, three different precise (known) reflection standards or one known reflection standard plus one known transmission standard should be used to calibrate symmetrical test fixtures. for the asymmetrical cases, three known standards, including at least one transmission standard, should be used. the thru-open-match (tom) and thru-short-match (tsm) techniques are the simplest methods, and they have no bandwidth limitation. when the standards are imprecise (unknown), it is recommended to use any suitable technique, such as the thru-reflect-line, line-reflect-line, thru-short-delay, thru-open-delay,line-reflect-match, line-reflect-reflect-match, or multiline methods, to accurately determine the values of the required calibration terms and, in addition, to use the tom or tsm method with the same imprecise standards to resolve the phase uncertainty. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/12792]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhu NH. Phase uncertainty in calibrating microwave test fixtures[J]. ieee transactions on microwave theory and techniques,1999,47(10):1917-1922. |
| APA | Zhu NH.(1999).Phase uncertainty in calibrating microwave test fixtures.ieee transactions on microwave theory and techniques,47(10),1917-1922. |
| MLA | Zhu NH."Phase uncertainty in calibrating microwave test fixtures".ieee transactions on microwave theory and techniques 47.10(1999):1917-1922. |
入库方式： OAI收割
来源：半导体研究所
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