Correlation of calibration equations for test fixtures
文献类型：期刊论文
| 作者 | Zhu NH ; Auracher F |
| 刊名 | ieee transactions on microwave theory and techniques
 |
| 出版日期 | 1999 |
| 卷号 | 47期号:10页码:1949-1953 |
| 关键词 | calibration microwave network analyzer scattering-parameter measurement test fixtures LINE NETWORK-ANALYZER CALIBRATION |
| ISSN号 | 0018-9480 |
| 通讯作者 | zhu nh,chinese acad sci,inst semicond,beijing 100083,peoples r china. |
| 中文摘要 | this paper begins from the thru-short-open (tso) and thru-line-match (tlm) methods to investigate the correlation of the calibration equations of these two methods, the relations among the measurements with the corresponding standards are obtained. it is found that the line standard with zero length can be used instead of ideal open and short, in case that two test fixtures are symmetrical. for asymmetrical fixtures, the measurements with the standards line, open and short are related at certain frequencies, and the matched load can be replaced by the line standards. the relations established are used to test short and match standards and analyze the freqpuency limits of the tso method, good agreement between theory and experiment is obtained, it is found that the tso method becomes very poor when the insertion phase of the thru standard is near n pi/4, and this method has a lower frequency limit. the tlm method is found unsuitable for calibrating asymmetrical fixtures. |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-08-12 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/12794]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Zhu NH,Auracher F. Correlation of calibration equations for test fixtures[J]. ieee transactions on microwave theory and techniques,1999,47(10):1949-1953. |
| APA | Zhu NH,&Auracher F.(1999).Correlation of calibration equations for test fixtures.ieee transactions on microwave theory and techniques,47(10),1949-1953. |
| MLA | Zhu NH,et al."Correlation of calibration equations for test fixtures".ieee transactions on microwave theory and techniques 47.10(1999):1949-1953. |
入库方式： OAI收割
来源：半导体研究所
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