中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Fabrication of InGaAs quantum dots with an underlying InGaAlAs layer on GaAs(100) and high index substrates by molecular beam epitaxy

文献类型:期刊论文

作者Ye XL; Xu B
刊名journal of crystal growth
出版日期1999
卷号205期号:4页码:607-612
关键词quantum dots InGaAs/InGaAlAs adjusting layer molecular beam epitaxy high index GAAS
ISSN号0022-0248
通讯作者jiang wh,chinese acad sci,inst semicond,lab semicond mat sci,pob 912,beijing 100083,peoples r china.
中文摘要in this paper, ingaas quantum dots with an adjusting ingaalas layer underneath are grown on (n 1 1)a/b (n = 2-5) and the reference (1 0 0) substrates by molecular beam epitaxy. small and dense ingaas quantum dots are formed on (1 0 0) and (n 1 1)b substrates. a comparative study by atomic force microscopy shows that the alignment and uniformity for ingaas quantum dots are greatly improved on(5 1 1)b but deteriorated on (3 1 1)b surface, demonstrating the great influence of the buried ingaalas layer. there is an increase in photoluminescence intensity and a decrease in the full-width at half-maximum when n varies from 2 to 5. quantum dots formed on (3 1 1)a and (5 1 1)a surfaces are large and random in distribution, and no emission from these dots can be detected. (c) 1999 elsevier science b.v. all rights reserved.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/12808]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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GB/T 7714
Ye XL,Xu B. Fabrication of InGaAs quantum dots with an underlying InGaAlAs layer on GaAs(100) and high index substrates by molecular beam epitaxy[J]. journal of crystal growth,1999,205(4):607-612.
APA Ye XL,&Xu B.(1999).Fabrication of InGaAs quantum dots with an underlying InGaAlAs layer on GaAs(100) and high index substrates by molecular beam epitaxy.journal of crystal growth,205(4),607-612.
MLA Ye XL,et al."Fabrication of InGaAs quantum dots with an underlying InGaAlAs layer on GaAs(100) and high index substrates by molecular beam epitaxy".journal of crystal growth 205.4(1999):607-612.

入库方式: OAI收割

来源:半导体研究所

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