中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Interference effects in differential reflectance spectra of the GaAs epilayers grown on Si substrate

文献类型:期刊论文

作者Jiang DS
刊名journal of applied physics
出版日期1998
卷号84期号:11页码:6466-6468
关键词SEMICONDUCTORS SPECTROSCOPY
ISSN号0021-8979
通讯作者zhao ms,qufu normal univ,laser res inst,shandong 273165,peoples r china. 电子邮箱地址: mszhao@ji-public.sd.cninfo.net
中文摘要we report the observation of oscillating features in differential reflectance spectra from the gaas epilayer grown on si substrate in the energy range both below and above the fundamental band gap. it is demonstrated that the oscillating features are due to the difference in the interference between two neighboring areas of the sample. the interference arises from two light beams reflected from different interfaces of the sample. the calculated spectra in the nonabsorption region are in good agreement with measured data. it is shown that the interference effect can be used as a sensitive method to characterize the inhomogeneity of the semiconductor heterostructures. (c) 1998 american institute of physics. [s0021-8979(98)08723-4].
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-08-12
源URL[http://ir.semi.ac.cn/handle/172111/13058]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Jiang DS. Interference effects in differential reflectance spectra of the GaAs epilayers grown on Si substrate[J]. journal of applied physics,1998,84(11):6466-6468.
APA Jiang DS.(1998).Interference effects in differential reflectance spectra of the GaAs epilayers grown on Si substrate.journal of applied physics,84(11),6466-6468.
MLA Jiang DS."Interference effects in differential reflectance spectra of the GaAs epilayers grown on Si substrate".journal of applied physics 84.11(1998):6466-6468.

入库方式: OAI收割

来源:半导体研究所

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