中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study on the precision measurement of high-flux large aperture sampling grating

文献类型:会议论文

作者YUAN Hao-yu ; CHEN Yong-quan ; PENG Zhi-tao ; DUAN Ya-xuan ; WU Jian-hong ; FU Shao-jun
出版日期2012
会议名称6th international symposium on advanced optical manufacturing and testing technologies: optical test and measurement technology and equipment
卷号8417
页码84170w
中文摘要this paper describes an effective method for the measurements of large aperture sampling grating, the sampling efficiency the sampling focal length and the sampling angle. by using a 351nm collimation laser source to scan the full aperture of the sampling grating in every subregion, the diffraction power of "0" order and "+1" order can be obtained synchronously by two standard integrating balls, and then by calculating the sampling efficiency of this subregion and splicing the acquisition data, we can get the averaged grating sampling efficiency in the full aperture.based on this method, we can effectively eliminate the effect of the output instability of laser source, decrease the uncertainty of test results. according to the fabrication principle of the sampling grating, measurements for the sampling focal length and the sampling angle can be performed. test rersults indicate that this method can be used to measure large aperture sampling gratings.
收录类别CPCI(ISTP) ; EI
合作状况国内
产权排序2
会议录6th international symposium on advanced optical manufacturing and testing technologies: optical test and measurement technology and equipment
会议录出版者spie
会议录出版地p.o. box 10, bellingham, wa 98227-0010, united states
语种英语
ISSN号0277786x
ISBN号9780819490995
源URL[http://ir.opt.ac.cn/handle/181661/20862]  
专题西安光学精密机械研究所_检测技术研究中心
推荐引用方式
GB/T 7714
YUAN Hao-yu,CHEN Yong-quan,PENG Zhi-tao,et al. Study on the precision measurement of high-flux large aperture sampling grating[C]. 见:6th international symposium on advanced optical manufacturing and testing technologies: optical test and measurement technology and equipment.

入库方式: OAI收割

来源:西安光学精密机械研究所

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