中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study of Si/SiO2 hybrid antireflective coatings on SLD prepared by DSEBET - art. no. 69842P

文献类型:会议论文

作者Sun, MX ; Tan, MQ ; Zhao, M
出版日期2008
会议名称6th international conference on thin film physics and applications
会议日期sep 25-28, 2007
会议地点shanghai, peoples r china
关键词antireflective coatings superluminescent diodes double source electron beam evaporation technology
页码6984: p9842-p9842
通讯作者sun, mx, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china.
中文摘要we introduce a double source electron beam evaporation (dsebet) technique in this paper. the refractive index coatings were fabricated on k9 glass substrate by adjusting the evaporation rates of two independent sources. the coatings, which were described by atomic force microscopy (afm), show good compactness and homogeneity. the antireflective (ar) coatings were fabricated on superluminescent diodes (sld) by dsebet. the hybrid ar coatings on the facets of sld were prepared in evaporation rates of 0.22nm/s and 0.75nm/s for silicon and silicon dioxide, respectively. the results of afm and spectral performance of coated sld show that dsebet has a promising future in preparing the coatings on optoelectronic devices.
英文摘要we introduce a double source electron beam evaporation (dsebet) technique in this paper. the refractive index coatings were fabricated on k9 glass substrate by adjusting the evaporation rates of two independent sources. the coatings, which were described by atomic force microscopy (afm), show good compactness and homogeneity. the antireflective (ar) coatings were fabricated on superluminescent diodes (sld) by dsebet. the hybrid ar coatings on the facets of sld were prepared in evaporation rates of 0.22nm/s and 0.75nm/s for silicon and silicon dioxide, respectively. the results of afm and spectral performance of coated sld show that dsebet has a promising future in preparing the coatings on optoelectronic devices.; zhangdi于2010-03-09批量导入; made available in dspace on 2010-03-09t02:11:53z (gmt). no. of bitstreams: 1 672.pdf: 333946 bytes, checksum: c5513a59f6a14fe768175e8318e9ae9a (md5) previous issue date: 2008; shanghai jiao tong univ, dept phys.; natl nat sci fdn china.; chinese phys soc.; shanghai phys soc.; spie.; [sun, m. x.; tan, m. q.; zhao, m.] chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
收录类别CPCI-S
会议主办者shanghai jiao tong univ, dept phys.; natl nat sci fdn china.; chinese phys soc.; shanghai phys soc.; spie.
会议录thin film physics and applications,sixth international conference
会议录出版者spie-int soc optical engineering ; 1000 20th st, po box 10, bellingham, wa 98227-0010 usa
学科主题光电子学
会议录出版地1000 20th st, po box 10, bellingham, wa 98227-0010 usa
语种英语
ISSN号0277-786x
ISBN号978-0-8194-7182-6
源URL[http://ir.semi.ac.cn/handle/172111/7786]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Sun, MX,Tan, MQ,Zhao, M. Study of Si/SiO2 hybrid antireflective coatings on SLD prepared by DSEBET - art. no. 69842P[C]. 见:6th international conference on thin film physics and applications. shanghai, peoples r china. sep 25-28, 2007.

入库方式: OAI收割

来源:半导体研究所

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