Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses - art. no. 68380Q
文献类型：会议论文
| 作者 | Wen, JM ; Zhu, NH ; Zhang, T |
| 出版日期 | 2008 |
| 会议名称 | 2nd conference on optoelectronic devices and integration |
| 会议日期 | nov 12-15, 2007 |
| 会议地点 | beijing, peoples r china |
| 关键词 | frequency response additional modulation modulation index chirp parameters optical and electrical spectra analyses |
| 页码 | 6838: q8380-q8380 |
| 通讯作者 | zhu, nh, chinese acad sci, inst semicond, state key lab integrated optoelect, pob 912, beijing 100083, peoples r china. |
| 中文摘要 | in this paper, we presents the characterization technique of high-speed optoelectronics devices based electrical and optical spectra, which is as important access to the devices performance as the prevalent vector network analyzer (vna) sweeping method. the measurement of additional modulation of laser and frequency response of photodetector from electrical spectra, and the estimation of the modulation indexes and the chirp parameters of directly modulated lasers based on optical spectra analysis, are given as examples. |
| 英文摘要 | in this paper, we presents the characterization technique of high-speed optoelectronics devices based electrical and optical spectra, which is as important access to the devices performance as the prevalent vector network analyzer (vna) sweeping method. the measurement of additional modulation of laser and frequency response of photodetector from electrical spectra, and the estimation of the modulation indexes and the chirp parameters of directly modulated lasers based on optical spectra analysis, are given as examples.; zhangdi于2010-03-09批量导入; made available in dspace on 2010-03-09t02:11:54z (gmt). no. of bitstreams: 1 679.pdf: 573826 bytes, checksum: 37fb3990486e93fc1ce8cc85d4724005 (md5) previous issue date: 2008; spie.; chinese opt soc.; [wen, ji min; zhu, ning hua; zhang, tao] chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
| 收录类别 | CPCI-S |
| 会议主办者 | spie.; chinese opt soc. |
| 会议录 | optoelectronic devices and integration ii
 |
| 会议录出版者 | spie-int soc optical engineering ; 1000 20th st, po box 10, bellingham, wa 98227-0010 usa |
| 学科主题 | 光电子学 |
| 会议录出版地 | 1000 20th st, po box 10, bellingham, wa 98227-0010 usa |
| 语种 | 英语 |
| ISSN号 | 0277-786x |
| ISBN号 | 978-0-8194-7013-3 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/7800]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Wen, JM,Zhu, NH,Zhang, T. Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses - art. no. 68380Q[C]. 见:2nd conference on optoelectronic devices and integration. beijing, peoples r china. nov 12-15, 2007. |
入库方式： OAI收割
来源：半导体研究所
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