中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406

文献类型:会议论文

作者Liu, J ; Zhang, SJ ; Hu, YH ; Xie, L ; Huang, YZ ; Zhu, NH
出版日期2008
会议名称conference on semiconductor lasers and applications iii
会议日期nov 12-13, 2007
会议地点beijing, peoples r china
关键词semiconductor optical amplifier microwave frequency response direct-subtracting method vector network analyzer multisectional model rate equation steady state small-signal state
页码6824: 82406-82406
通讯作者liu, j, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china.
中文摘要the measurement and analysis of the microwave frequency response of semiconductor optical amplifiers (soas) are proposed in this paper. the response is measured using a vector network analyzer. then with the direct-subtracting method, which is based on the definition of scattering parameters of optoelectronic devices, the responses of both the optical signal source and the photodetector are eliminated, and the response of only the soa is extracted. some characteristics of the responses can be observed: the responses are quasi-highpass; the gain increases with the bias current; and the response becomes more gradient while the bias current is increasing. the multisectional model of an soa is then used to analyze the response theoretically. by deducing from the carrier rate equation of one section under the steady state and the small-signal state, the expression of the frequency response is obtained. then by iterating the expression, the response of the whole soa is simulated. the simulated results are in good agreement with the measured on the three main characteristics, which are also explained by the deduced results. this proves the validity of the theoretical analysis.
英文摘要the measurement and analysis of the microwave frequency response of semiconductor optical amplifiers (soas) are proposed in this paper. the response is measured using a vector network analyzer. then with the direct-subtracting method, which is based on the definition of scattering parameters of optoelectronic devices, the responses of both the optical signal source and the photodetector are eliminated, and the response of only the soa is extracted. some characteristics of the responses can be observed: the responses are quasi-highpass; the gain increases with the bias current; and the response becomes more gradient while the bias current is increasing. the multisectional model of an soa is then used to analyze the response theoretically. by deducing from the carrier rate equation of one section under the steady state and the small-signal state, the expression of the frequency response is obtained. then by iterating the expression, the response of the whole soa is simulated. the simulated results are in good agreement with the measured on the three main characteristics, which are also explained by the deduced results. this proves the validity of the theoretical analysis.; zhangdi于2010-03-09批量导入; made available in dspace on 2010-03-09t02:11:58z (gmt). no. of bitstreams: 1 707.pdf: 346405 bytes, checksum: 24b867fcd2b464f8d5ccc953e7eac570 (md5) previous issue date: 2008; spie.; chinese opt soc.; [liu, jian; hu, yong-hong; xie, liang; huang, yong-zhen; zhu, ning-hua] chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
收录类别CPCI-S
会议主办者spie.; chinese opt soc.
会议录semiconductor lasers and applications iii
会议录出版者spie-int soc optical engineering ; 1000 20th st, po box 10, bellingham, wa 98227-0010 usa
学科主题光电子学
会议录出版地1000 20th st, po box 10, bellingham, wa 98227-0010 usa
语种英语
ISSN号0277-786x
ISBN号978-0-8194-6999-1
源URL[http://ir.semi.ac.cn/handle/172111/7852]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Liu, J,Zhang, SJ,Hu, YH,et al. Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406[C]. 见:conference on semiconductor lasers and applications iii. beijing, peoples r china. nov 12-13, 2007.

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来源:半导体研究所

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