Impact of diode facet reflectivity on the fiber grating external cavity semiconductor laser
文献类型：会议论文
| 作者 | Xu QY ; Chen SW |
| 出版日期 | 2004 |
| 会议名称 | 5th international conference on thin film physics and applications |
| 会议日期 | may 31-jun 02, 2004 |
| 会议地点 | shanghai, peoples r china |
| 关键词 | fiber grating |
| 页码 | 5774: 519-522 |
| 通讯作者 | xu, qy, chinese acad sci, inst semicond, pob 912, beijing 100083, peoples r china. |
| 中文摘要 | the scattering matrix method is used to analyze the multiple reflection effect between the laser diode facet and the fiber grating facet by considering the fiber grating external cavity laser diode (fgecl) as a four-mirror cavity laser. when neglecting other important parameters such as butt-coupling distance between the diode and the fiber facets, coupling efficiency, external cavity length, it is shown that low reflectivity is not a crucial factor for the laser characteristics such as smsr. experimentally high smsr fiber grating external cavity laser is fabricated with a relatively large residual facet reflectivity (about 1%), which is coincident with our simulation results. |
| 英文摘要 | the scattering matrix method is used to analyze the multiple reflection effect between the laser diode facet and the fiber grating facet by considering the fiber grating external cavity laser diode (fgecl) as a four-mirror cavity laser. when neglecting other important parameters such as butt-coupling distance between the diode and the fiber facets, coupling efficiency, external cavity length, it is shown that low reflectivity is not a crucial factor for the laser characteristics such as smsr. experimentally high smsr fiber grating external cavity laser is fabricated with a relatively large residual facet reflectivity (about 1%), which is coincident with our simulation results.; zhangdi于2010-03-29批量导入; zhangdi于2010-03-29批量导入; chinese phys soc.; shanghai phys soc.; natl nat sci fdn china.; e china normal univ, sch informat sci & technol.; fudan univ, appl surface phys lab.; natl lab infrared phys.; cas, shanghai inst tech phys.; e china normal univ, key lab opt & magnet resonance spectroscopy.; chinese acad sci, inst semicond, beijing 100083, peoples r china |
| 收录类别 | 其他 |
| 会议主办者 | chinese phys soc.; shanghai phys soc.; natl nat sci fdn china.; e china normal univ, sch informat sci & technol.; fudan univ, appl surface phys lab.; natl lab infrared phys.; cas, shanghai inst tech phys.; e china normal univ, key lab opt & magnet resonance spectroscopy. |
| 会议录 | fifth international conference on thin film physics and applications丛书标题: proceedings of the society of photo-optical instrumentation engineers (spie)
 |
| 会议录出版者 | spie-int soc optical engineering ; 1000 20th st, po box 10, bellingham, wa 98227-0010 usa |
| 学科主题 | 光电子学 |
| 会议录出版地 | 1000 20th st, po box 10, bellingham, wa 98227-0010 usa |
| 语种 | 英语 |
| ISSN号 | 0277-786x |
| ISBN号 | 0-8194-5755-8 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/10070]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Xu QY,Chen SW. Impact of diode facet reflectivity on the fiber grating external cavity semiconductor laser[C]. 见:5th international conference on thin film physics and applications. shanghai, peoples r china. may 31-jun 02, 2004. |
入库方式： OAI收割
来源：半导体研究所
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