Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source
文献类型：专利
| 作者 | KITAOKA, YASUO; YOKOYAMA, TOSHIFUMI; YAMAMOTO, KAZUHISA |
| 发表日期 | 2006-07-25 |
| 专利号 | US7082146 |
| 著作权人 | MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source |
| 英文摘要 | A method for easily and quickly evaluating the wavelength variability properties of a wavelength-variable semiconductor laser is provided. An inspection device includes a power source for supplying current to a wavelength-variable DBR semiconductor laser having an active region, a phase control region, and a DBR region, a photo-detector for detecting an output intensity of laser beam emitted from the wavelength-variable DBR semiconductor laser, and a transmission type wavelength-selection element that can be inserted into a light path from the wavelength-variable DBR semiconductor laser to the photo-detector. In a state where the transmission type wavelength-selection element is inserted into the light path from the wavelength-variable DBR semiconductor laser to the photo-detector, at least one of a phase current that is supplied to the phase control region and a DBR current that is supplied to the DBR region is changed with respect to a predetermined active current that is supplied to the active region, and the output intensity of the laser beam after the laser beam has passed through the transmission type wavelength-selection element is detected by the photo-detector. |
| 公开日期 | 2006-07-25 |
| 申请日期 | 2005-08-04 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/44625]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
| 推荐引用方式 GB/T 7714 | KITAOKA, YASUO,YOKOYAMA, TOSHIFUMI,YAMAMOTO, KAZUHISA. Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source. US7082146. 2006-07-25. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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