Method to control the thickness of an antireflection coating and implementation installation
文献类型：专利
| 作者 | LANDREAU, JEAN; NAKAJIMA, HISAO |
| 发表日期 | 1991-06-18 |
| 专利号 | US5024853 |
| 著作权人 | ETAT FRANCAIS REPRESENTE PAR LE MINISTRE DES POSTES, DES TELECOMMUNICATIONS ET DE L'ESPACE (CENTRE NATIONAL D'ETUDES DES TELECOMMUNICATIONS |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Method to control the thickness of an antireflection coating and implementation installation |
| 英文摘要 | Method to control the thickness of an antireflection coating. According to the invention, the semi-conductive structure (14) is fed with a constant current (16) and the voltage (24) is measured at its terminals. This voltage passes through a maximum when the reflectivity of the antireflection coating passes through a minimum. Application for the embodiment of semi-conductive lasers. |
| 公开日期 | 1991-06-18 |
| 申请日期 | 1990-06-28 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/45618]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | ETAT FRANCAIS REPRESENTE PAR LE MINISTRE DES POSTES, DES TELECOMMUNICATIONS ET DE L'ESPACE (CENTRE NATIONAL D'ETUDES DES TELECOMMUNICATIONS |
| 推荐引用方式 GB/T 7714 | LANDREAU, JEAN,NAKAJIMA, HISAO. Method to control the thickness of an antireflection coating and implementation installation. US5024853. 1991-06-18. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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