Method and apparatus for measuring gas concentration using a semiconductor laser
文献类型：专利
| 作者 | WALKER, STEPHEN D.; NICHOLS, ROBERT A.; CURNAN, WILLIAM A.; SVAI, SOPHAT; BRAIG, JAMES R.; GOLDBERGER, DANIEL S. |
| 发表日期 | 2000-07-18 |
| 专利号 | US6091504 |
| 著作权人 | UDT SENSORS, INC. |
| 国家 | 美国 |
| 文献子类 | 授权发明 |
| 其他题名 | Method and apparatus for measuring gas concentration using a semiconductor laser |
| 英文摘要 | A system and method for determining the concentration of an analyte such as oxygen in an unknown gas sample. A Vertical Cavity Surface Emitting Laser (VCSEL) is used as a variable wavelength light source which is "swept" through a wavelength range by varying the drive signal applied thereto. Quantitative spectroscopic analysis of the unknown gas sample is performed without the requirement of feedback circuitry for tuning the light source to the characteristic frequency of an analyte. Instead, the VCSEL is repeatedly "swept" through a range of frequencies determined by the drive signal, and the absorption is measured by the detector. The absorption lines do not always occur at the same place but instead move along around during the sweep based on the temperature and baseline current. The absorption at a particular wavelength may be determined by overlaying the drive signal and its timing information over the detected absorption signal. |
| 公开日期 | 2000-07-18 |
| 申请日期 | 1998-05-21 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/49078]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | UDT SENSORS, INC. |
| 推荐引用方式 GB/T 7714 | WALKER, STEPHEN D.,NICHOLS, ROBERT A.,CURNAN, WILLIAM A.,et al. Method and apparatus for measuring gas concentration using a semiconductor laser. US6091504. 2000-07-18. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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